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2005
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F. Fiori, P.S. Crovetti, "A new compact temperature-compensated CMOS current
reference", IEEE Trans. on Circuits and Systems II, vol.
52 , Issue: 11, Nov. 2005, pag. 724-728.
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F. Fiori, F. Musolino, "Investigation on the correlation between IC-conducted
emission and chip-level power supply current", IEEE Trans. on Electromagnetic
Compatibility, vol. 47, Issue 1, Feb. 2005 pag. 28-33.
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P.S. Crovetti, F.Fiori, "Nonlinear effects of RF interference in SC circuits",
IEEE European Conference on Circuit Theory and Design (ECCTD), Cork (IR), sept.
2005, vol.2, pag. 39-42.
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F. Fiori, M. Merlo, P. Bompieri "Design of an Alternator Voltage regulator
immune to EMI", Proceedings of the Int. Symp on Industrial Electronics
(ISIE05), Dubrovnik (KR), June 2005, vol.2, pag. 447-450.
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P.S. Crovetti, F. Fiori, "RFI-induced failures in switched capacitor circuits",
IEEE International Symposium on EMC, Chicago (USA), Aug. 2005, vol.1, pag.
53-59.
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F. Musolino, F. Fiori, "Investigation on the susceptibility of microcontrollers
to EFT Interference", IEEE International Symposium on EMC, Chicago (USA), Aug.
2005, vol.2, pag. 410-413.
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F.Fiori, P.S. Crovetti, "EMC issues in linear voltage regulator circuit design
for SoC applications", 5th Int. workshop on EMC of ICs (EMC-COMPO 05), Munich 05
(GER), Nov. pag. 45-50.
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2004
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F. Musolino, F. Fiori, "Investigation on the control of microcontrollers
conducted emission by design" , 17th Int. Symp. on EMC, Wroclaw (PL), June 04,
pp. 294-297.
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F. Fiori, F. Musolino, "Correlation between building block power supply currents
and conducted emission of digital ICs" , EMC Europe, Sept. 2004, pp. 396-399.
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F. Fiori, "EMI-induced failures in PWM controllers for
SMPS", EMC Europe, Sept. 2004, pp. 410-413.
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F. Fiori, F. Musolino, "A new technique for
the measurement of IC susceptibility to electrical fast transients", EMC
Europe, Sept. 2004, pp. 147-150.
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F. Fiori, P. Crovetti, "Analysis of opamp operation under high power EMI",
EuroEM 04, Magdeburg, June 2004, p. 95.
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F. Fiori, F. Musolino, “Investigation on the effectiveness of the IC
susceptibility TEM cell method”, IEEE Trans. On Electromagnetic Compatibility,
vol. 46 , Issue: 1 , Feb. 2004
ISSN 0018-9375.
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F. Fiori, P.S. Crovetti, “Investigation of EMI effects in Bandgap voltage
references”, Issue: 35, Microelectronics Journal – Elsevier. ISSN
0026-2692.
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2003
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F.
Fiori, P.S. Crovetti, “Prediction of EMI effects in operational
amplifiers by a two input Volterra series model”, IEE Proceedings on
Circuit, Devices & Systems, vol. 150, no. 3, pp. 185-193, June 2003,
ISSN 1350-2409 |
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F.
Fiori, F. Musolino, “Comparison of IC
conducted measurement methods”, IEEE Trans. on Instrumentation and
Measurement, vol. 52, no.3, pp. 839- 845, June 2003, ISSN 0018-9456. |
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F.
Fiori, P.S. Crovetti, “Design of a CMOS opamp input stage immune to
EMI”, International Journal of Electronics, vol. 90, no. 2, pp.
99-108, Taylor & Francis, ISSN 0020-7217. |
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F.
Fiori, P. S. Crovetti, “Demodulation of radio frequency in CMOS
operational amplifiers”, accepted for publication on IEICE Trans. on
Electronics. ISSN 0916-8524 |
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F.
Fiori, F. Musolino, “Measurement of IC radiated emission by a novel
technique”, 15th Int. Zurich Symp. on Electromagnetic compatibility,
Zurich, Switzerland, Feb. 18-20, 2003, pp. 365-368. |
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F.
Fiori, P.S. Crovetti, “Comparison of the susceptibility to EMI of MOS
and BJT operational amplifiers”, 15th Int. Zurich Symp. on
Electromagnetic compatibility, Zurich, Switzerland, Feb. 18-20, 2003,
pp. 369-372.
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2002
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F. Fiori, P.S.
Crovetti, "Complementary differential pair with a high immunity to RFI",
IEE Electronics Letters, vol. 38, no. 25, pp. 1663-1664, Dec. 2002,
ISSN 0013-5194. |
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F. Fiori, "A
new nonlinear model of EMI-induced distortion phenomena in feedback
CMOS operational amplifier", IEEE Trans. on Electromagnetic
Compatibility, vol. 44, no.4, pp. 521-527, Nov. 2002, ISSN 0018-9375. |
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F. Fiori, P.S.
Crovetti, “Nonlinear effects of RF
interference in operational amplifiers,” IEEE Trans. on Circuit
and System, part I, vol. 49, no.3, pp. 367-372, Mar. 2002, ISSN
1057-7122. |
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F. Fiori, P.S.
Crovetti, "A high immunity complementary differential pair", Int.
Workshop on
EMC (CEM COMPO), Toulouse, nov. 2002, pp 126-130 |
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F. Fiori, P.S.
Crovetti, "Investigation on EMI effects in bandgap voltage
references", Int. Workshop on EMC (CEM COMPO), Toulouse, nov. 2002, pp
35-39. |
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F. Fiori, P.S.
Crovetti, "Linear voltage regulator susceptibility to conducted EMI",
IEEE Int Symp. on industrial electronics, L'Aquila, July 2002, pp.
1398-1403. |
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F.Fiori, F.
Musolino, "Influence of the 1ohm method test setup on IC conducted
emission measurement", Int.
Symp. on EMC, Wroclaw PL,
Jun. 2002, pp. 289-292. |
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F.Fiori, F.
Crovetti "A new complementary differential pair with high immunity
features", Int. Symp.
on EMC, Wroclaw PL, Jun. 2002, pp. 389-392. |
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F. Fiori,
"Measurement of IC susceptibility to RF interference by a new
injection probe", IEEE Int.
Symp. on EMC - Sorrento IT,
Sept. 2002, pp. 115-118. |
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F.Fiori, F.
Musolino, "Mesurement of IC conducted emissions by using a coupled
microstripline structure", IEEE Int. Symp. on EMC - Sorrento IT, Sept.
2002, pp. 119-122. |
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F. Fiori, F.
Musolino, P.S. Crovetti, "A critical assessment of the TEM cell IC
susceptibility test method", IEEE Int. Symp. on EMC - Sorrento IT,
Sept. 2002, pp. 499-502. |
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F. Fiori,
"Susceptibility of analog IC applications", in the Tutorial documents
of the IEEE Int. Symp. on EMC - Sorrento IT, Sept. 2002, pp. 125-137. |
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M.Citron, M.
Corradin, S. Buso, G. Spiazzi, F. Fiori, “Susceptibility of Integrated
Circuits to RFI: Analysis of PWM Current-Mode controllers for SMPS”,
IECON 2002, Sevilla, Spain, Nov. 2002, pp. 3227-3231. |
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V. Pozzolo, P.
Tenti, F. Fiori, G. Spiazzi, S. Buso, "Susceptibility of Integrated
Circuits to RFI", CPES Annual Seminar, Blacksburg, April 2002,
pp.I-10¸I-15. |
2001
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F. Fiori,
S.Pignari, “Assessment of Digital Integrated- Circuit Electromagnetic
Emission Bases on Radiated Power Evaluation,” IEEE Trans. on
Electromagnetic Compatibility – Special Issue, vol. 43, no.4, pp.
531-537 ,Nov. 2001, ISSN 0018-9375. |
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F. Fiori,
F.Musolino, “Measurement of Integrated Circuit conducted emission by
using a transverse electromagnetic (TEM) cell,” IEEE Trans. on
Electromagnetic Compatibility, vol. 43, no.4, pp. 622-628, Nov. 2001,
ISSN 0018-9375.
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F. Fiori, “Operational
amplifier input stage robust to EMI”, IEE Electronics Letters,
vol. 37, no.15, pp. 930-931, July, 2001. ISSN 0013-5194. |
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F. Fiori,
“Experimental evaluation of IC susceptibility to RFI”, Compliance
Engineering, vol. 18, no.2, pp. 62-65, March 2001. |
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L.M. Reynery,
F.Fiori, F.Gregoretti, “Clock tree optimization to reduce EM emissions
of VLSI circuits”, 14th Int. Zurich Symp. on Electromagnetic
compatibility, Zurich, Switzerland, Feb. 20-22, 2001, pp. 585-588. |
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F. Fiori,
“Susceptibility of analog cells to substrate interference”, IEEE Int.
Conf. on Design, Automation and test in Europe, Munich, Germany,
March. 13-16, 2001, p. 814. |
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F. Fiori, F.
Musolino, “Analysis of EME produced by a microcontroller operation”,
IEEE Int. Conf. on Design, Automation and test in Europe, Munich,
Germany, March. 13-16, 2001, pp. 341-345. |
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F. Fiori, F.
Musolino, “Measurement of IC conducted emission by a novel technique”,
IV Int. Symp. on EMC and electromagnetic ecology, St. Petersburg ,
Russia, June. 19-22, 2001, pp.134-138. |
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F. Fiori,
P.S.Crovetti, V.Pozzolo, “Prediction of RF interference in operational
amplifier by a new analytical model”, IEEE Int. Symp on
electromagnetic compatibility, Montreal, Canada, Aug. 13-17, 2001, pp.
1164-1168. |
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F. Fiori, F.
Musolino, V. Pozzolo, “Weakness of the TEM cell method in evaluating
IC radiated emissions”, IEEE Int. Symp on electromagnetic
compatibility, Montreal, Canada, Aug. 13-17, 2001, pp.135-138. |
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F. Fiori,
P.S.Crovetti, “Nonlinear effects of RF interference in MOS operational
amplifier”, IEEE Int. Symp on Electronics, Circuits and System (ICECS),
Malta, Sept. 2-5, 2001, pp. 201-204. |
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F. Fiori,
F.Musolino, “Comparison of IC conducted emission measurement methods”,
IEEE Int. Conf. on Electromagnetics in Advanced Applications, Torino,
Italy, Sept. 10-14, 2001, pp. 319-322. |
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F. Fiori, F.
Musolino, “Investigations on Integrated Circuit Direct radiated
Emissions” , IV Int. Symp. on EMC and electromagnetic ecology, St.
Petersburg , Russia, June. 19-22, 2001. |
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