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2005

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F. Fiori, P.S. Crovetti, "A new compact temperature-compensated CMOS current reference", IEEE Trans. on Circuits and Systems II, vol. 52 , Issue: 11, Nov. 2005, pag. 724-728.

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F. Fiori, F. Musolino, "Investigation on the correlation between IC-conducted emission and chip-level power supply current", IEEE Trans. on Electromagnetic Compatibility, vol. 47, Issue 1, Feb. 2005 pag. 28-33.

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P.S. Crovetti, F.Fiori, "Nonlinear effects of RF interference in SC circuits", IEEE European Conference on Circuit Theory and Design (ECCTD), Cork (IR), sept. 2005, vol.2, pag. 39-42.

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F. Fiori, M. Merlo, P. Bompieri "Design of an Alternator Voltage regulator immune to EMI", Proceedings of the Int. Symp on Industrial Electronics (ISIE05), Dubrovnik (KR), June 2005, vol.2, pag. 447-450.

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P.S. Crovetti, F. Fiori, "RFI-induced failures in switched capacitor circuits", IEEE International Symposium on EMC, Chicago (USA), Aug. 2005, vol.1, pag. 53-59.

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F. Musolino, F. Fiori, "Investigation on the susceptibility of microcontrollers to EFT Interference", IEEE International Symposium on EMC, Chicago (USA), Aug. 2005, vol.2, pag. 410-413.

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F.Fiori, P.S. Crovetti, "EMC issues in linear voltage regulator circuit design for SoC applications", 5th Int. workshop on EMC of ICs (EMC-COMPO 05), Munich 05 (GER), Nov. pag. 45-50. 

 

2004

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F. Musolino, F. Fiori, "Investigation on the control of microcontrollers conducted emission by design" , 17th Int. Symp. on EMC, Wroclaw (PL), June 04, pp. 294-297.

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F. Fiori, F. Musolino, "Correlation between building block power supply currents and conducted emission of digital ICs" , EMC Europe, Sept. 2004, pp. 396-399.

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F. Fiori, "EMI-induced failures in PWM controllers for SMPS", EMC Europe, Sept. 2004, pp. 410-413.

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F. Fiori, F. Musolino, "A new technique for the measurement of IC susceptibility to electrical fast transients", EMC Europe, Sept. 2004, pp. 147-150.

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F. Fiori, P. Crovetti, "Analysis of opamp operation under high power EMI", EuroEM 04, Magdeburg, June 2004, p. 95.

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F. Fiori, F. Musolino, “Investigation on the effectiveness of the IC susceptibility TEM cell method”, IEEE Trans. On Electromagnetic Compatibility, vol. 46 , Issue: 1 , Feb. 2004
 ISSN 0018-9375.

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F. Fiori, P.S. Crovetti, “Investigation of EMI effects in Bandgap voltage references”, Issue: 35,  Microelectronics Journal – Elsevier. ISSN 0026-2692.

 

2003

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F. Fiori, P.S. Crovetti, “Prediction of EMI effects in operational amplifiers by a two input Volterra series model”, IEE Proceedings on Circuit, Devices & Systems, vol. 150, no. 3, pp. 185-193, June 2003, ISSN 1350-2409

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F. Fiori, F. Musolino, “Comparison of IC conducted measurement methods”, IEEE Trans. on Instrumentation and Measurement, vol. 52, no.3, pp. 839- 845, June 2003, ISSN 0018-9456.

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F. Fiori, P.S. Crovetti, “Design of a CMOS opamp input stage immune to EMI”, International Journal of Electronics, vol. 90, no. 2, pp. 99-108, Taylor & Francis, ISSN 0020-7217.

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F. Fiori, P. S. Crovetti, “Demodulation of radio frequency in CMOS operational amplifiers”, accepted for publication on IEICE Trans. on Electronics. ISSN 0916-8524

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F. Fiori, F. Musolino, “Measurement of IC radiated emission by a novel technique”, 15th Int. Zurich Symp. on Electromagnetic compatibility, Zurich, Switzerland, Feb. 18-20, 2003, pp. 365-368.

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F. Fiori, P.S. Crovetti, “Comparison of the susceptibility to EMI of MOS and BJT operational amplifiers”, 15th Int. Zurich Symp. on Electromagnetic compatibility, Zurich, Switzerland, Feb. 18-20, 2003, pp. 369-372.
 

2002

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F. Fiori, P.S. Crovetti, "Complementary differential pair with a high immunity to RFI", IEE Electronics Letters, vol. 38, no. 25, pp. 1663-1664, Dec. 2002, ISSN 0013-5194.

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F. Fiori, "A new nonlinear model of EMI-induced distortion phenomena in feedback CMOS operational amplifier", IEEE Trans. on Electromagnetic Compatibility, vol. 44, no.4, pp. 521-527, Nov. 2002, ISSN 0018-9375.

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F. Fiori, P.S. Crovetti, “Nonlinear effects of RF interference in operational amplifiers,” IEEE Trans. on Circuit and System, part I, vol. 49, no.3, pp. 367-372, Mar. 2002, ISSN 1057-7122.

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F. Fiori, P.S. Crovetti, "A high immunity complementary differential pair",  Int. Workshop on EMC (CEM COMPO), Toulouse, nov. 2002, pp 126-130

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F. Fiori, P.S. Crovetti, "Investigation on EMI effects in bandgap voltage references", Int. Workshop on EMC (CEM COMPO), Toulouse, nov. 2002, pp 35-39.

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F. Fiori, P.S. Crovetti, "Linear voltage regulator susceptibility to conducted EMI", IEEE Int Symp. on industrial electronics, L'Aquila, July 2002, pp. 1398-1403.

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F.Fiori, F. Musolino, "Influence of the 1ohm method test setup on IC conducted emission measurement", Int. Symp. on EMC,  Wroclaw PL, Jun. 2002, pp. 289-292.

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F.Fiori, F. Crovetti "A new complementary differential pair with high immunity features", Int. Symp. on EMC,  Wroclaw PL, Jun. 2002, pp. 389-392.

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F. Fiori, "Measurement of IC susceptibility to RF interference by a new injection  probe", IEEE Int. Symp. on EMC - Sorrento IT, Sept. 2002, pp. 115-118.

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F.Fiori, F. Musolino, "Mesurement of IC conducted emissions by using a coupled microstripline structure", IEEE Int. Symp. on EMC - Sorrento IT, Sept. 2002, pp. 119-122.

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F. Fiori, F. Musolino, P.S. Crovetti, "A critical assessment of the TEM cell IC susceptibility test method", IEEE Int. Symp. on EMC - Sorrento IT, Sept. 2002,  pp. 499-502.

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F. Fiori, "Susceptibility of analog IC applications", in the Tutorial documents of the IEEE Int. Symp. on EMC - Sorrento IT, Sept. 2002, pp. 125-137.

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M.Citron, M. Corradin, S. Buso, G. Spiazzi, F. Fiori, “Susceptibility of Integrated Circuits to RFI: Analysis of PWM Current-Mode controllers for SMPS”, IECON 2002, Sevilla, Spain, Nov. 2002, pp. 3227-3231.

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V. Pozzolo, P. Tenti, F. Fiori, G. Spiazzi, S. Buso, "Susceptibility of Integrated Circuits to RFI", CPES Annual Seminar, Blacksburg, April 2002, pp.I-10¸I-15.

 

2001

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F. Fiori, S.Pignari, “Assessment of Digital Integrated- Circuit Electromagnetic Emission Bases on Radiated Power Evaluation,” IEEE Trans. on Electromagnetic Compatibility – Special Issue, vol. 43, no.4, pp. 531-537 ,Nov. 2001, ISSN 0018-9375.

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F. Fiori, F.Musolino, “Measurement of Integrated Circuit conducted emission by using a transverse electromagnetic (TEM) cell,” IEEE Trans. on Electromagnetic Compatibility, vol. 43, no.4, pp. 622-628, Nov. 2001, ISSN 0018-9375.  

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F. Fiori, “Operational amplifier input stage robust to EMI”, IEE Electronics Letters, vol. 37, no.15, pp. 930-931, July, 2001. ISSN 0013-5194.

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F. Fiori, “Experimental evaluation of IC susceptibility to RFI”, Compliance Engineering, vol. 18, no.2, pp. 62-65, March 2001. 

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L.M. Reynery, F.Fiori, F.Gregoretti, “Clock tree optimization to reduce EM emissions of VLSI circuits”, 14th Int. Zurich Symp. on Electromagnetic compatibility, Zurich, Switzerland, Feb. 20-22, 2001, pp. 585-588.

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F. Fiori, “Susceptibility of analog cells to substrate interference”, IEEE Int. Conf. on Design, Automation and test in Europe, Munich, Germany, March. 13-16, 2001, p. 814.

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F. Fiori, F. Musolino, “Analysis of EME produced by a microcontroller operation”, IEEE Int. Conf. on Design, Automation and test in Europe, Munich, Germany, March. 13-16, 2001, pp. 341-345.

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F. Fiori, F. Musolino, “Measurement of IC conducted emission by a novel technique”, IV Int. Symp. on EMC and electromagnetic ecology, St. Petersburg , Russia, June. 19-22, 2001, pp.134-138. 

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F. Fiori, P.S.Crovetti, V.Pozzolo, “Prediction of RF interference in operational amplifier by a new analytical model”, IEEE Int. Symp on electromagnetic compatibility, Montreal, Canada, Aug. 13-17, 2001, pp. 1164-1168.

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F. Fiori, F. Musolino, V. Pozzolo, “Weakness of the TEM cell method in evaluating IC radiated emissions”, IEEE Int. Symp on electromagnetic compatibility, Montreal, Canada, Aug. 13-17, 2001, pp.135-138.

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F. Fiori, P.S.Crovetti, “Nonlinear effects of RF interference in MOS operational amplifier”, IEEE Int. Symp on Electronics, Circuits and System (ICECS), Malta, Sept. 2-5, 2001, pp. 201-204.

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F. Fiori, F.Musolino, “Comparison of IC conducted emission measurement methods”, IEEE Int. Conf. on Electromagnetics in Advanced Applications, Torino, Italy, Sept. 10-14, 2001, pp. 319-322.

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F. Fiori, F. Musolino, “Investigations on Integrated Circuit Direct radiated Emissions” , IV Int. Symp. on EMC and electromagnetic ecology, St. Petersburg , Russia, June. 19-22, 2001.